Your search returned 6 results.

Results
		New methods of concurrent checking / by Michael Goessel ... [et al.] by Gössel, Michael Series: Frontiers in electronic testing ; 42 Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Specialized; Publication details: Dordrecht ; London : Springer, 2008 Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7874 .N49 2008. Place hold Log in to add tags Add to cart (remove)
		Fault injection techniques and tools for embedded systems reliability evaluation / edited by Alfredo Benso and Paolo Prinetto by Benso, Alfredo Prinetto, Paolo Series: Frontiers in electronic testing ; 23 Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Pub., 2003 Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7895.E42 F38 2003. Place hold Log in to add tags Add to cart (remove)
		Emerging nanotechnologies : test, defect tolerance, and reliability / [edited by] Mohammad Tehranipoor by Tehranipoor, Mohammad Series: Frontiers in electronic testing ; v. 37 Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Specialized; Publication details: New York : Springer , 2008 Availability: Items available for loan: UMPLIB GAMBANG (1)Call number: T174.7 .E44 2008. Place hold Log in to add tags Add to cart (remove)
		Embedded processor-based self-test / by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian. by Gizopoulos, Dimitris Paschalis, Antonis Zorian, Yervant Series: Frontiers in electronic testing Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Adult; Publication details: Boston : Kluwer Academic Publishers, 2004 Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK 7895 .E42 G59 2004. Place hold Log in to add tags Add to cart (remove)
		Elements of STIL : principles and applications of IEEE Std. 1450 / by Gragory A. Maston, Tony R. Taylor, Julie N. Villar by Maston, Gregory A Taylor, Tony R Villar, Julie N Series: Frontiers in electronic testing ; 24 Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Pub., 2003 Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7874.58 .M37 2003. Place hold Log in to add tags Add to cart (remove)
		The core test wrapper handbook : rationale and application of IEEE Std. 1500™ / by Francisco da Silva, Teresa McLaurin, Tom Waayers by da Silva, Francisco McLaurin, Teresa Waayers, Tom Series: Frontiers in electronic testing ; 35 Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Specialized; Publication details: New York : Springer Science + Business Media , 2006 Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7895.E42 D75 2006. Place hold Log in to add tags Add to cart (remove)