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New methods of concurrent checking / by Michael Goessel ... [et al.] by Series: Frontiers in electronic testing ; 42
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Publication details: Dordrecht ; London : Springer, 2008
Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7874 .N49 2008.

Fault injection techniques and tools for embedded systems reliability evaluation / edited by Alfredo Benso and Paolo Prinetto by Series: Frontiers in electronic testing ; 23
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Boston : Kluwer Academic Pub., 2003
Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7895.E42 F38 2003.

Emerging nanotechnologies : test, defect tolerance, and reliability / [edited by] Mohammad Tehranipoor by Series: Frontiers in electronic testing ; v. 37
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Publication details: New York : Springer , 2008
Availability: Items available for loan: UMPLIB GAMBANG (1)Call number: T174.7 .E44 2008.

Embedded processor-based self-test / by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian. by Series: Frontiers in electronic testing
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Publication details: Boston : Kluwer Academic Publishers, 2004
Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK 7895 .E42 G59 2004.

Elements of STIL : principles and applications of IEEE Std. 1450 / by Gragory A. Maston, Tony R. Taylor, Julie N. Villar by Series: Frontiers in electronic testing ; 24
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Boston : Kluwer Academic Pub., 2003
Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7874.58 .M37 2003.

The core test wrapper handbook : rationale and application of IEEE Std. 1500™ / by Francisco da Silva, Teresa McLaurin, Tom Waayers by Series: Frontiers in electronic testing ; 35
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Publication details: New York : Springer Science + Business Media , 2006
Availability: Items available for loan: UMPLIB PEKAN (1)Call number: TK7895.E42 D75 2006.

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