Nanometrology DVO8PUB12 /
Nanometrology DVO8PUB12 / [video recording]:
produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel
- [Dearborne, Mich.] : Society of Manufacturing Engineers, c2009
- 1 digital video disc (DVD) (33min.): color ; 12cm.
- Manufacturing insights .
- Manufacturing insights .
Library internal view only.
Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)
Disc compatible with computer DVD drive and DVD player.
MED0000534(Local)
Nanostructured materials--Measurement
Microscopy--Measurement
Library internal view only.
Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)
Disc compatible with computer DVD drive and DVD player.
MED0000534(Local)
Nanostructured materials--Measurement
Microscopy--Measurement