MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01618ngm a2200265 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
vtls000081583 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20251117141042.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
140703t2009 miu33 g s0 vceng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
MED0000534(Local) |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
|---|
| Level of rules in bibliographic description |
201905271148 |
| Level of effort used to assign nonsubject heading access points |
nazri |
| Level of effort used to assign subject headings |
201412021043 |
| Level of effort used to assign classification |
iswan |
| -- |
201407031438 |
| -- |
nadia |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
dvd QC39 .N36 2009 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Nanometrology |
| Medium |
[video recording]: |
| Remainder of title |
DVO8PUB12 / |
| Statement of responsibility, etc. |
produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Name of publisher, distributor, etc. |
[Dearborne, Mich.] : |
| -- |
Society of Manufacturing Engineers, |
| Date of publication, distribution, etc. |
c2009 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
1 digital video disc (DVD) (33min.): |
| Other physical details |
color ; |
| Dimensions |
12cm. |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Manufacturing insights |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Library internal view only. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy) |
| 538 ## - SYSTEM DETAILS NOTE |
|---|
| System details note |
Disc compatible with computer DVD drive and DVD player. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Nanostructured materials |
| General subdivision |
Measurement |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Microscopy |
| General subdivision |
Measurement |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Manufacturing insights |