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Nanometrology [video recording]: DVO8PUB12 / produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel

Material type: Film

FilmSeries: Manufacturing insightsPublication details: [Dearborne, Mich.] : Society of Manufacturing Engineers, c2009Description: 1 digital video disc (DVD) (33min.): color ; 12cmISBN:

MED0000534(Local)

Subject(s):

Summary: Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)

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Title notes ( 3 )

Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
CD and DVD	UMPLIB PEKAN	dvd QC39 .N36 2009 (Browse shelf(Opens below))	1	Not for loan		0000089021

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Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)

Disc compatible with computer DVD drive and DVD player.