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VLSI test principles and architectures : design for testability /

VLSI test principles and architectures : design for testability / edited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen - San Fransisco, CA : Morgan Kaufmann, 2006 - 777 p. : ill. ; 24 cm.

ISBN: 0123705975

Subjects--Topical Terms:
Integrated circuits--Very large scale integration--Testing
Integrated circuits--Very large scale integration--Design

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