MARC details
| 000 -LEADER |
|---|
| fixed length control field |
00967nam a2200241 a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
vtls000020097 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20251117144330.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
070612t2006 caua f 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0123705975 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
|---|
| Level of rules in bibliographic description |
201207031141 |
| Level of effort used to assign nonsubject heading access points |
Fida |
| Level of effort used to assign subject headings |
201107131917 |
| Level of effort used to assign classification |
VLOAD |
| Level of effort used to assign subject headings |
201105271101 |
| Level of effort used to assign classification |
Fida |
| Level of effort used to assign subject headings |
200908141323 |
| Level of effort used to assign classification |
VLOAD |
| -- |
200706121422 |
| -- |
training |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7874.75 .V57 2006 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
VLSI test principles and architectures : |
| Remainder of title |
design for testability / |
| Statement of responsibility, etc. |
edited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
San Fransisco, CA : |
| Name of publisher, distributor, etc. |
Morgan Kaufmann, |
| Date of publication, distribution, etc. |
2006 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
777 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Testing |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Design |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wang, Laung-Terng |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wu, Cheng-Wen |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wen, Xiaoqing |