VLSI test principles and architectures : design for testability / edited by Laung-Tern Wang, Cheng-Wen Wu, Xiaoqing Wen

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Material type: Text

TextPublication details: San Fransisco, CA : Morgan Kaufmann, 2006Description: 777 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7874.75 .V57 2006 (Browse shelf(Opens below))	1	Available		0000023496