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Characterization of microstructures by analytical electron microscopy (AEM) /

Rong, Yonghua

Characterization of microstructures by analytical electron microscopy (AEM) / Yonghua Rong - Berlin : Beijing : Springer ; Higher Education Press, c2012 - xviii, 552 p. : ill. ; 24 cm.

Includes bibliographical references and index

ISBN: 9783642201189

Subjects--Topical Terms:
Nanostructured materials--Nondestructive testing
Electron microscopy

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