Characterization of microstructures by analytical electron microscopy (AEM) / (Record no. 46932)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00848nam a2200229 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | vtls000059924 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20251117145454.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 120522t2012 gw a f b 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9783642201189 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] | |
| Level of rules in bibliographic description | 201207171609 |
| Level of effort used to assign nonsubject heading access points | jamie |
| -- | 201205221035 |
| -- | farina |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) | |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) | TA417.23 .R66 2012 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Rong, Yonghua |
| 245 10 - TITLE STATEMENT | |
| Title | Characterization of microstructures by analytical electron microscopy (AEM) / |
| Statement of responsibility, etc. | Yonghua Rong |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Berlin : |
| Name of publisher, distributor, etc. | Springer ; |
| Place of publication, distribution, etc. | Beijing : |
| Name of publisher, distributor, etc. | Higher Education Press, |
| Date of publication, distribution, etc. | c2012 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xviii, 552 p. : |
| Other physical details | ill. ; |
| Dimensions | 24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references and index |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Nanostructured materials |
| General subdivision | Nondestructive testing |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electron microscopy |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Cost, normal purchase price | Total checkouts | Full call number | Barcode | Date last seen | Copy number | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Not lost | UMPLIB PEKAN | UMPLIB PEKAN | 04/09/2019 | 461.39 | TA417.23 .R66 2012 | 0000065694 | 04/09/2019 | 1 | 461.39 | 04/09/2019 | Open Shelf |