Characterization of microstructures by analytical electron microscopy (AEM) / Yonghua Rong

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Material type: Text

TextPublication details: Berlin : Springer ; Beijing : Higher Education Press, c2012Description: xviii, 552 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TA417.23 .R66 2012 (Browse shelf(Opens below))	1	Available		0000065694

Includes bibliographical references and index