High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen
- Pittsburgh, Pa. : Materials Research Society, 1990
- xi, 391 p. : ill. ; 24 cm.
- Materials Research Society symposium proceedings, v. 183 0272-9172 ; .
- Materials Research Society symposia proceedings ; v. 183 .
Includes bibliographical references and indexes
9781558990722 1558990720
Materials--Microscopy--Congresses
Materials--Defects--Congresses
High resolution electron microscopy--Congresses
Includes bibliographical references and indexes
9781558990722 1558990720
Materials--Microscopy--Congresses
Materials--Defects--Congresses
High resolution electron microscopy--Congresses