MARC details
| 000 -LEADER |
| fixed length control field |
01326nam a2200313 a 4500 |
| 001 - CONTROL NUMBER |
| control field |
vtls000061649 |
| 003 - CONTROL NUMBER IDENTIFIER |
| control field |
KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20251125093536.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
120611t1990 paua f 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
9781558990722 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
1558990720 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
| Level of rules in bibliographic description |
201304021151 |
| Level of effort used to assign nonsubject heading access points |
saini |
| -- |
201206111151 |
| -- |
safura |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TA417.23 .H54 1990 |
| 245 00 - TITLE STATEMENT |
| Title |
High resolution electron microscopy of defects in materials : |
| Remainder of title |
symposium held April 16-18, 1990, San Francisco, California, U.S.A. / |
| Statement of responsibility, etc. |
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
| Place of publication, distribution, etc. |
Pittsburgh, Pa. : |
| Name of publisher, distributor, etc. |
Materials Research Society, |
| Date of publication, distribution, etc. |
1990 |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xi, 391 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 490 1# - SERIES STATEMENT |
| Series statement |
Materials Research Society symposium proceedings, |
| International Standard Serial Number |
0272-9172 ; |
| Volume/sequential designation |
v. 183 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
| Bibliography, etc. note |
Includes bibliographical references and indexes |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Microscopy |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Defects |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
High resolution electron microscopy |
| Form subdivision |
Congresses |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Sinclair, Robert |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Smith, David J. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Dahmen, Ulrich |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
| Corporate name or jurisdiction name as entry element |
Materials Research Society |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
| Uniform title |
Materials Research Society symposia proceedings ; |
| Volume/sequential designation |
v. 183 |