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High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen
Material type:
TextSeries: Materials Research Society symposia proceedings ; v. 183Publication details: Pittsburgh, Pa. : Materials Research Society, 1990Description: xi, 391 p. : ill. ; 24 cmISBN: - 9781558990722
- 1558990720
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
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UMPLIB PEKAN | TA417.23 .H54 1990 (Browse shelf(Opens below)) | 1 | Available | 0000071757 |
Includes bibliographical references and indexes