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Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors by C. V. Thompson, J. R. Lloyd - Pittsburgh, PA : Materials Research Society, c1992 - ix, 328 p. : ill. ; 24 cm. - Materials Research Society symposium proceedings ; v. 265 . - Materials Research Society symposium proceedings .

Includes bibliographical references and index

ISBN: 9781558991606 1558991603

Subjects--Topical Terms:
Microelectronics--Reliability--Congresses
Microelectronics--Materials--Testing--Congresses
Electrodiffusion--Congresses
Microstructure--Congresses--Congresses

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