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Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors by C. V. Thompson, J. R. Lloyd
Material type:
TextSeries: Materials Research Society symposium proceedingsPublication details: Pittsburgh, PA : Materials Research Society, c1992Description: ix, 328 p. : ill. ; 24 cmISBN: - 9781558991606
- 1558991603
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
|
UMPLIB PEKAN | TK7874 .M38 1992 (Browse shelf(Opens below)) | 1 | Available | 0000075110 |
Includes bibliographical references and index