Materials reliability in microelectronics II : (Record no. 69840)

MARC details
000 -LEADER
fixed length control field 01272nam a2200301 a 4500
001 - CONTROL NUMBER
control field vtls000061985
003 - CONTROL NUMBER IDENTIFIER
control field KUKTEM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251125093942.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120615t1992 paua f b 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781558991606
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1558991603
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201307101434
Level of effort used to assign nonsubject heading access points jamie
Level of effort used to assign subject headings 201307101432
Level of effort used to assign classification jamie
-- 201206151045
-- safura
040 ## - CATALOGING SOURCE
Original cataloging agency UMP
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7874 .M38 1992
245 00 - TITLE STATEMENT
Title Materials reliability in microelectronics II :
Remainder of title symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /
Statement of responsibility, etc. editors by C. V. Thompson, J. R. Lloyd
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Pittsburgh, PA :
Name of publisher, distributor, etc. Materials Research Society,
Date of publication, distribution, etc. c1992
300 ## - PHYSICAL DESCRIPTION
Extent ix, 328 p. :
Other physical details ill. ;
Dimensions 24 cm.
490 1# - SERIES STATEMENT
Series statement Materials Research Society symposium proceedings ;
Volume/sequential designation v. 265
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
General subdivision Reliability
-- Congresses
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
General subdivision Materials
-- Testing
-- Congresses
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electrodiffusion
General subdivision Congresses
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microstructure
General subdivision Congresses
Form subdivision Congresses
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Thompson, C. V.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Lloyd, J. R.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Materials Research Society symposium proceedings
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total checkouts Full call number Barcode Date last seen Copy number Cost, replacement price Price effective from Koha item type
  Not lost     UMPLIB PEKAN UMPLIB PEKAN 04/09/2019 103.77   TK7874 .M38 1992 0000075110 04/09/2019 1 103.77 04/09/2019 Open Shelf

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