SiGe and Si strained-layer epitaxy for silicon heterostructure devices / (Record no. 43980)

MARC details
000 -LEADER
fixed length control field 01330nam a2200289 a 4500
001 - CONTROL NUMBER
control field vtls000030026
003 - CONTROL NUMBER IDENTIFIER
control field KUKTEM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251117145327.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 080707t2008 nyua f 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781420066852 (alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1420066854 (alk. paper)
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201107132117
Level of effort used to assign nonsubject heading access points VLOAD
Level of effort used to assign subject headings 200908141602
Level of effort used to assign classification VLOAD
Level of effort used to assign subject headings 200908141535
Level of effort used to assign classification VLOAD
Level of effort used to assign subject headings 200908132055
Level of effort used to assign classification VLOAD
-- 200807071302
-- saini
040 ## - CATALOGING SOURCE
Original cataloging agency UMP
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7871.96.B55 S54 2008
245 00 - TITLE STATEMENT
Title SiGe and Si strained-layer epitaxy for silicon heterostructure devices /
Statement of responsibility, etc. edited by John D. Cressler.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Boca Raton :
Name of publisher, distributor, etc. CRC Press/Taylor & Francis,
Date of publication, distribution, etc. 2008
300 ## - PHYSICAL DESCRIPTION
Extent 1 v. (various pagings) :
Other physical details ill. ;
Dimensions 26 cm.
500 ## - GENERAL NOTE
General note "The material was previously published in Silicon heterostructure handbook : materials, fabrication, devices, circuits and applications of SiGe and Si strained-layer epitaxy, Taylor and Francis, 2005"--T.p. verso.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Bipolar transistors
General subdivision Materials.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Heterostructures.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Silicon
General subdivision Electric properties.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Epitaxy
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Cressler, John D.
730 0# - ADDED ENTRY--UNIFORM TITLE
Uniform title Silicon heterostructure handbook
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total checkouts Full call number Barcode Date last seen Copy number Cost, replacement price Price effective from Koha item type
  Not lost     UMPLIB PEKAN UMPLIB PEKAN 04/09/2019 235.92   TK7871.96.B55 S54 2008 0000035765 04/09/2019 1 235.92 04/09/2019 Open Shelf

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