MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01743nam a2200325 a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
vtls000060670 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
KUKTEM |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20251125093332.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
120531t2009 paua f 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781605111285 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
1605111287 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
|---|
| Level of rules in bibliographic description |
201301310934 |
| Level of effort used to assign nonsubject heading access points |
saini |
| Level of effort used to assign subject headings |
201205311005 |
| Level of effort used to assign classification |
safura |
| -- |
201205311004 |
| -- |
safura |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UMP |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7871.99.M44 C56 2009 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
CMOS gate-stack scaling-- materials, interfaces and reliability implications : |
| Remainder of title |
symposium held April 14-16, 2009, San Francisco, California, U.S.A. / |
| Statement of responsibility, etc. |
editors, Alexander A. Demkov ... [et al.] |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Warrendale, Pa. : |
| Name of publisher, distributor, etc. |
Materials Research Society, |
| Date of publication, distribution, etc. |
2009 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
viii, 179 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Materials Research Society symposium proceedings |
| Volume/sequential designation |
v. 1155 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
" ... Symposium C, ’CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,’ held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- Preface |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and indexes |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal oxide semiconductors, Complementary |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal oxide semiconductors |
| General subdivision |
Materials |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Silicides |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Gate array circuits |
| Form subdivision |
Congresses |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Demkov, Alexander A. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
Materials Research Society. |
| Subordinate unit |
Meeting |
| Date of meeting or treaty signing |
(2009 : |
| Location of meeting |
San Francisco, Calif.) |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Symposium C, "CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications" |
| Date of meeting or treaty signing |
(2009 : |
| Location of meeting |
San Francisco, Calif.) |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Materials Research Society symposium proceedings |
| Volume/sequential designation |
v. 1155 |